Achieving superior band gap, refractive index and morphology in composite oxide thin film systems violating the Moss rule
dc.contributor.author | Sahoo, Naba K. | |
dc.contributor.author | Thakur, Sudhakar | |
dc.contributor.author | Tokas, Raj B. | |
dc.date.accessioned | 2007-09-17T09:56:48Z | |
dc.date.available | 2007-09-17T09:56:48Z | |
dc.date.issued | 2006 | |
dc.format.extent | 4357 bytes | |
dc.format.mimetype | text/html | |
dc.identifier.uri | http://hdl.handle.net/123456789/547 | |
dc.language.iso | en | en |
dc.subject | energy gap | en |
dc.subject | refractive index | en |
dc.subject | Moss rule | en |
dc.subject | oxide composite | en |
dc.subject | polarizability properties | en |
dc.subject | semiconductors | en |
dc.subject | dielectrics | en |
dc.title | Achieving superior band gap, refractive index and morphology in composite oxide thin film systems violating the Moss rule | en |
dc.type | Article | en |