Fractals and superstructures in gadolinia thin film morphology: Influence of process variables on their characteristics parameters
dc.contributor.author | Sahoo, Naba K. | |
dc.contributor.author | Thakur, Sudhakar | |
dc.contributor.author | Tokas, Raj B. | |
dc.date.accessioned | 2007-09-18T11:01:19Z | |
dc.date.available | 2007-09-18T11:01:19Z | |
dc.date.issued | 2006 | |
dc.format.extent | 4807 bytes | |
dc.format.mimetype | text/html | |
dc.identifier.uri | http://hdl.handle.net/123456789/609 | |
dc.language.iso | en | en |
dc.subject | Reactive electron beam evaporation | en |
dc.subject | Surface microroughness | en |
dc.subject | Morphology | en |
dc.subject | Power spectral density | en |
dc.subject | Optical coating | en |
dc.subject | Fractals | en |
dc.subject | Superstructures | en |
dc.title | Fractals and superstructures in gadolinia thin film morphology: Influence of process variables on their characteristics parameters | en |
dc.type | Article | en |