An ellipsometric investigation of Ag/SiO2 nanocomposite thin films

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dc.contributor.authorRoy, R. K.
dc.contributor.authorMandal, S. K.
dc.contributor.authorBhattacharyya, D.
dc.date.accessioned2021-08-25T04:29:16Z
dc.date.available2021-08-25T04:29:16Z
dc.date.issued2003
dc.description.divisionSpect. Div.en
dc.format.extent4078 bytes
dc.format.mimetypetext/html
dc.identifier.sourceEuropean Physical Journal-B, 2003. Vol. 34 (1): pp. 25-31en
dc.identifier.urihttp://hdl.handle.net/123456789/23324
dc.language.isoenen
dc.subjectOptical properties of nanoscale materials and structuresen
dc.subjectNanocrystals and nanoparticlesen
dc.subjectBruggeman effective medium theoryen
dc.subjectdielectric behavioren
dc.subjectnanocomposite thin filmsen
dc.titleAn ellipsometric investigation of Ag/SiO2 nanocomposite thin filmsen
dc.typeArticleen

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