A robust methodology for high precision isotopic analysis of boron by thermal ionization mass spectrometry using Na2BO2+ ion
dc.contributor.author | Rao, R. M. | |
dc.contributor.author | Parab, A. R. | |
dc.contributor.author | Sasibhushan, K. | |
dc.contributor.author | Aggarwal, S. K. | |
dc.date.accessioned | 2010-08-06T09:22:16Z | |
dc.date.available | 2010-08-06T09:22:16Z | |
dc.date.issued | 2009 | |
dc.format.extent | 4727 bytes | |
dc.format.mimetype | text/html | |
dc.identifier.uri | http://hdl.handle.net/123456789/3417 | |
dc.language.iso | en | en |
dc.subject | 11B/10B isotopic ratio | en |
dc.subject | Na2BO2+ | en |
dc.subject | Single filament | en |
dc.subject | Thermal ionization mass spectrometry | en |
dc.subject | Precision | en |
dc.title | A robust methodology for high precision isotopic analysis of boron by thermal ionization mass spectrometry using Na2BO2+ ion | en |
dc.type | Article | en |