VISAR signal analysis with an emphasis on ellipse fitting
dc.contributor.author | Sur, A. | |
dc.contributor.author | Joshi, K. D. | |
dc.contributor.author | Sharma, A. | |
dc.contributor.author | Kaushik, T. C. | |
dc.date.accessioned | 2018-06-15T07:01:17Z | |
dc.date.available | 2018-06-15T07:01:17Z | |
dc.date.issued | 2017 | |
dc.description.division | APD;A&PPD | en |
dc.format.extent | 4605 bytes | |
dc.format.mimetype | text/html | |
dc.identifier.source | Review of Scientific Instruments, 2017. Vol. 88 (12): pp. 125002.1-pp.125002.12 | en |
dc.identifier.uri | http://hdl.handle.net/123456789/16453 | |
dc.language.iso | en | en |
dc.subject | VISAR signal analysis | en |
dc.subject | ellipse fitting | en |
dc.subject | Bookstein algebraic fitting method | en |
dc.subject | numerical simulation | en |
dc.subject | ellipse fitting technique | en |
dc.title | VISAR signal analysis with an emphasis on ellipse fitting | en |
dc.type | Article | en |