VISAR signal analysis with an emphasis on ellipse fitting

dc.contributor.authorSur, A.
dc.contributor.authorJoshi, K. D.
dc.contributor.authorSharma, A.
dc.contributor.authorKaushik, T. C.
dc.date.accessioned2018-06-15T07:01:17Z
dc.date.available2018-06-15T07:01:17Z
dc.date.issued2017
dc.description.divisionAPD;A&PPDen
dc.format.extent4605 bytes
dc.format.mimetypetext/html
dc.identifier.sourceReview of Scientific Instruments, 2017. Vol. 88 (12): pp. 125002.1-pp.125002.12en
dc.identifier.urihttp://hdl.handle.net/123456789/16453
dc.language.isoenen
dc.subjectVISAR signal analysisen
dc.subjectellipse fittingen
dc.subjectBookstein algebraic fitting methoden
dc.subjectnumerical simulationen
dc.subjectellipse fitting techniqueen
dc.titleVISAR signal analysis with an emphasis on ellipse fittingen
dc.typeArticleen

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