Optical constants and thickness determination of thin films using envelope method and inverse synthesis method: A comparative study

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dc.contributor.authorJena, S.
dc.contributor.authorTokas, R. B.
dc.contributor.authorThakur, S.
dc.contributor.authorSahoo, N. K.
dc.date.accessioned2014-03-28T09:52:58Z
dc.date.available2014-03-28T09:52:58Z
dc.date.issued2013
dc.description.divisionASDen
dc.format.extent3703 bytes
dc.format.mimetypetext/html
dc.identifier.sourceAIP Conference Proceedings, 2013. Vol. 1512 (1): pp. 632-633en
dc.identifier.urihttp://hdl.handle.net/123456789/8997
dc.language.isoenen
dc.subjectoptical constantsen
dc.subjectthin filmen
dc.subjectenvelope methoden
dc.subjectinverse synthesisen
dc.titleOptical constants and thickness determination of thin films using envelope method and inverse synthesis method: A comparative studyen
dc.typeArticleen

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