Browsing by Author "Poswal, A. K."
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- Bond length variation in Zn substituted NiO studied from extended X-ray absorption fine structure(2017) Singh, S. D.; Poswal, A. K.; Kamal, C.; Rajput, P.; Chakrabarti, A.; Jha, S. N.; Ganguli, T.
- Characterization of ion beam sputter deposited W and Si films and W/Si interfaces by grazing incidence X-ray reflectivity, atomic force microscopy and spectroscopic ellipsometry(2008) Biswas, A.; Poswal, A. K.; Tokas, R. B.; Bhattacharyya, D.
- Characterization of r.f. sputtered thin Mo, W and Si films as precursors to multilayer X-ray mirrors(2006) Bhattacharyya, D.; Joseph, D.; Poswal, A. K.
- Characterization of Sb-doped Bi2UO6 solid solutions by X-ray Diffraction and X-ray absorption spectroscopy(2013) Misra, N. L.; Yadav, A. K.; Dhara, S.; Mishra, S. K.; Phatak, R.; Poswal, A. K.; Jha, S. N.; Sinha, A. K.; Bhattacharyya, D.
- Chemical ordering as a precursor to formation of ordered delta-UZr2 phase: a theoretical and experimental study(2021) Ghosh, P. S.; Arya, A.; Basak, C. B.; Poswal, A. K.
- Commissioning and First Results of Scanning Type EXAFS Beamline (BL-09) at INDUS-2 Synchrotron Source(2014) Poswal, A. K.; Agrawal, A.; Yadav, A. K.; Nayak, C.; Basu, S.; Kane, S. R.; Garg, C. K.; Bhattachryya, D.; Jha, S. N.; Sahoo, N. K.
- Comparative study of ionization chamber detectors vis-à-vis a CCD detector for dispersive XAS measurement in transmission geometry(2013) Poswal, A. K.; Agrawal, A.; Bhattachryya, D.; Jha, S. N.; Sahoo, N. K.
- Compositional partitioning during the spinodal decomposition in Cu-Ni-Sn alloy(2018) Basak, C. B.; Poswal, A. K.
- A comprehensive facility for EXAFS measurements at the INDUS-2 synchrotron source at RRCAT, Indore, India(2014) Basu, S.; Nayak, C.; Yadav, A. K.; Agrawal, A.; Poswal, A. K.; Bhattacharyya, D.; Jha, S. N.; Sahoo, N. K.
- Deposition and characterization of titania-silica optical multilayers by asymmetric bipolar pulsed dc sputtering of oxide targets(2010) Sagdeo, P. R.; Shinde, D. D.; Misal, J. S.; Kamble, N. M.; Tokas, R. B.; Biswas, A.; Poswal, A. K.; Thakur, S.; Bhattacharyya, D.; Sahoo, N. K.; Sabharwal, S. C.
- Depth dependent structure and magnetic properties and their correlation with magnetotransport in Fe/Au multilayers(2014) Singh, S.; Basu, Saibal; Prajapat, C. L.; Gupta, M.; Poswal, A. K.; Bhattacharya, D.
- Design, Fabrication and Testing of Elliptical Crystal Bender for the EXAFS Beam-Line at INDUS-II Synchrotron Source(2004) Das, N. C.; Jha, S. N.; Bhattacharyya, D.; Poswal, A. K.; Sinha, A. K.; Mishra, V. K.
- Effect of Ce4+-substitution at A and B sites of Nd2Zr2O7: A study for plutonium incorporation in pyrochlores(2020) Nandi, C.; Poswal, A. K.; Jafar, M.; Kesari, S.; Grover, V.; Rao, R.; Prakash, A.; Behere, P. G.
- Electrochemically controlled pitting corrosion in Ni film: A study of AFM and neutron reflectometry(2009) Singh, S.; Basu, Saibal; Poswal, A. K.; Tokas, R. B.; Ghosh, S. K.
- Electroless deposition, post annealing and characterization of nickel films on silicon(2008) Sabharwal, S.; Palit, S.; Tokas, R. B.; Poswal, A. K.; Sangeeta
- EXAFS investigations on PbMoO4 single crystals grown under different conditions(2012) Poswal, A. K.; Bhattacharyya, D.; Jha, S. N.; Sangeeta; Sabharwal, S. C.
- Growth of iron phthalocyanine nanoweb and nanobrush using molecular beam epitaxy(2008) Debnath, A. K.; Samanta, S.; Singh, A.; Aswal, D. K.; Gupta, S. K.; Yakhmi, J. V.; Deshpande, S. K.; Poswal, A. K.; Surgers, C.
- High-speed photon Doppler velocimetry for laser-driven flyer acceleration studies(2022) Chaurasia, S.; Mohan, A.; Poswal, A. K.
- Image evaluation of DCM based XAFS beamline at INDUS-2 SRS facility(2006) Das, N. C.; Lahiri, D.; Bhattacharyya, D.; Poswal, A. K.
- In situ measurement of ions parameters of laser produced ion source using high resolution Thomson Parabola Spectrometer(2016) Chaurasia, S.; Kaur, C.; Rastogi, V.; Poswal, A. K.; Munda, D. S.; Bhatia, R. K.; Nataraju, V.