Co doped ZnO thin films have been prepared using rf magnetron sputtering technique with varying Co doping concentration. GIXRD has been used to probe long range order and Zn, Co and Oxygen K-edge XAFS measurements have been used for investigating local structure around Zn and Co atoms. GIXRD results show wurzite structure of the samples while XANES and EXAFS results at Zn and Co K edge show that Co is going at Zn site in ZnO matrix and no other phase is present. These results are further confirmed by O K edge and Co L_2,3 edge XANES measurements.