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Author(s) |
Mathad, R. D.; Harish Kumar, H. G.; Sannakki, B.; Ganesh, S.; Sarma, K. S. S.; Badiger, M. V.
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The effect of an 8MeV electron-beam on the structural, optical and dielectric
properties of polystyrene films has been investigated respectively by means of
Fourier transform infrared (FTIR) spectroscopy, ultraviolet–visible
(UV–VIS) spectroscopy and electrical impedance (LCR) analysis over a radiation dose
in the range of 50–250 kGy using a Microtron accelerator. The FTIR spectral analysis
shows no change in the overall structure of the irradiated polystyrene films, except a minor change in the intensity of a few
peaks in the FTIR spectrum, indicating that polystyrene is resistant to electron-beam irradiation over the
range of radiation doses investigated. The optical band gap analysis using the UV–VIS absorption
spectra of the polystyrene shows a small decrease in the optical band gap (Eg) and the activation energy with an
increase in electron doses. Further, the dielectric measurements over a frequency range of 100 Hz to 1MHz
for the electron-beam-irradiated polystyrene films show that both the dielectric constant and the dielectric
loss increase with an increase in electron radiation dose, which may be ascribed to the formation of defect
sites in the band gap of polystyrene as a consequence of molecular chain scission in the polymer films
upon irradiation.
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