An extended X-ray absorption fine structure (EXAFS) beamline is being developed for the INDUS-II synchrotron source. Several optical and mechanical components of the beamline are exposed to high intensity synchrotron radiation while in operation. The temperature rise on different components of the beamline on exposure to the synchrotron beam has been simulated by finite element analysis. Design of the cooling mechanism for each of these components has been carried out and estimation of the temperature rise has also been done incorporating the cooling mechanism.