Author(s) |
Sanyal, K.; Dhara, S.; Sanjay Kumar, S.; Misra, N. L.; Mollick, P.
K.; Rao, P. T.; Venugopalan, R.; Pai, R. V.; Kumar, N.; Mukerjee, S. K.;
Chakravartty, J. K.; Aggarwal, S. K. (FCD;MG;PDD)
|
A
Total Reflection X-Ray Fluorescence (TXRF) methodology, employing
burn-leach test, was developed to assess the quality of SiC layer in
tristructural isotropic (TRISO) coated UO2 particles prepared
in BARC. The coated particles were heated at 1,123 K for about 96 h to
constant weight. The calcined particles, thus obtained, were then heated
in suprapure concentrated nitric acid. The supernatant was analysed for
trace elements by TXRF. No uranium was detected in this supernatant
solution. The study demonstrates the good quality of SiC layer and
applicability of TXRF for burn leach test of TRISO coated UO2 particles prepared. |