Author(s) |
Kim, J L; Lee, J I; Pradhan, A S; Chang, I; Kim, B H; Chung, K S; Choe, H S.
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Several thermal treatments in the temperature range from 2700C to 3200C (each of 10 min) were tested
as a final preparation procedure of LiF:Mg,Cu,Si to improve the protocol of TL readout with less residual
signal for the LiF:Mg,Cu, Si TLD. This high sensitivity LiF:Mg,Cu,Si TLD exhibited thermal stability much
better than that of the well known LiF:Mg,Cu, P. For LiF:Mg,Cu, Si, a readout temperature up to 3000C did
not affect the TL sensitivity and glow curve structure for 12 cycles of exposure and readout following an
initial thermal treatment at
295 0C for 10 min. The residual TL signal also remained negligible.
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