BARC/PUB/2014/1143

 
 

H2S Sensing Properties of RF Sputtered NiO Thin Films

 
     
 
Author(s)

Bagwaiya, T.; Goyal, C. P.; Bhattacharya, S.; Ramgir, N. S.; Bhattacharya, D.; Koiry, S. P.; Aswal, D. K.; Gupta, S. K.
(TPD;SSPD)

Source

AIP Conference Proceedings, 2014. Vol. 1591: pp. 938-940

ABSTRACT

NiO thin films prepared by RF sputtering have been investigated for possible gas sensing application. The sensor films having thickness of around 30 nm were extremely smooth exhibiting a surface roughness of ~0.7 Å. These films exhibited a highly sensitive and selective response towards H2S at an operating temperature of 300°C.

 
 
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