In this work, approximately 0.5μm thick diamond films were grown on a silicon substrate by hot filament chemical vapour deposition (HFCVD) method in a gas mixture of hydrogen and methane. The batch to batch reproducibility of the sample using this technique was found to be very good. The obtained film was characterized by micro laser Raman spectroscopy (MLRS), grazing incidence X-ray diffractometry (GIXRD), scanning electron microscopy (SEM) and atomic force miscroscopy (AFM) techniques. MLRS and GIXRD results confirmed the formation of diamond whereas SEM and AFM analyses indicated uniform morphology of the film with an average grain size of 200nm. The deposited film was studied for ionizing radiation dosimetry applications using the thermoluminescence (TL) and optically stimulated luminescence (OSL) techniques after irradiating the film by a calibrated 5mCi, ⁹⁰Sr/⁹⁰Y beta source. In the TL measurement, for a heating rate of 4K/s, broad glow curve was obtained which was deconvoluted into seven L peaks. The integrated TL counts were found to vary linearly with increasing the radiation dose up to 10kGy. The characteristic TL out put seen in the temperature range 200–300°C, may be considered good for thermal stability of the film and it could also avoid TL fading during storage and non- interference of any black body radiation during the measurement. However, in comparison to TL out put, the OSL response for 470nm LED stimulation was found to be lesser. The CW–OSL decay curve has shown two components contributing to the OSL signal, having photoionization cross-section 1.5x10^-18 and 5.2x10^-19 cm² respectively. The studies have revealed the possibility of using diamond film for high dose radiation dosimetry with TL/OSL method.