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Author(s) |
Maity, P.; Debnath, T.; Banerjee, T.; Das, A.; Ghosh, H. N. (RPCD)
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Source |
Journal of Physical Chemistry-C, 2016. Vol. 120 (18): pp. 10051-10061 |
ABSTRACT
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Charge-carrier dynamics of CdS quantum dot (QD) and CdS/CdSe type-I and CdS/CdTe type-II core−shell nanocrystals (NCs) sensitized with a Re(I)−polypyridyl complex have been carried with special emphasis on studies on carrier delocalization and the role of Re-complex as a hole acceptor and sensitizer molecule. Our investigation confirmed photoexcited hole transfer from CdS and CdS/CdSe to the Re-complex, while no hole transfer was observed in the CdS/CdTe−Re-complex system. This was rationalized by the evaluation of the relative energy levels, which revealed that such hole migration was not energetically favorable due to low-lying highest occupied molecular orbital (HOMO) of the Re-complex as compared with the valence band (VB) of CdTe shell; however, luminescence quenching from upper excited states of Re-complex was observed in the presence of all three QD and core−shell systems, which has been attributed to electron injection from hot state (energetically higher than the LUMO state) of the Re-complex to the conduction band (CB) of the QDs. Transient absorption ( λpump = 400 nm, λprobe = 450−750 nm) spectra recorded for Re-complex-sensitized CdS and CdS/CdSe composite in the femtosecond time domain revealed a broad transient absorption band in the 580−750 nm region with a peak around 595 nm, and this was attributed to the cation radical formation for Re-complex, either by capturing photoexcited hole from the NCs or by injecting electron to the CB of the NCs. As anticipated, no such spectrum was observed for the CdS/CdTe−Re-complex composite system after 400 nm excitation. Electron injection from photoexcited Re-complex to CdS QD and CdS/CdSe core−shell was found to be <100 fs, while the hole transfer from photoexcited CdS QD and CdS/CdSe core−shell to Re-complex took place within the time scale of 900 fs and 2.5 ps, respectively. |
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