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| Author(s) |
Singh, S.; Basu, S.; Prajapat, C. L.; Gupta, M.; Bhattacharya, D. |
| Source |
AIP Conference Proceedings, 2011. Vol. 1349: pp. 789-790 |
| ABSTRACT
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We have measured the magnetoresistance (MR) in two sets of Fe/Au multilayers, with varying (1) Fe layer thickness, tFe = 3-10 nm, and (2) Au layer thickness tAu = 5-15 nm, grown on Si substrates by sputtering. The multilayer interface structure and magnetic properties were studied by polarized neutron reflectometry (PNR). The study was undertaken to understand the correlation between structure of these multilayers and their magneto-transport properties. |
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