Bose, P. P.; Mittal, R.; Chaplot, S. L.; Patwe, S. J.; Achary, S. N.; Tyagi, A. K.
ABSTRACT
The compound ThGeO4 can be stabilized in both the zircon and scheelite phases at ambient conditions. We
have measured thermal expansion in both the phases of ThGeO4 by high temperature X-ray diffraction experiments
carried out up to 1273 K. We find that thermal expansion in scheelite phase is about 50 % more in
comparison of the zircon phase. A transferable interatomic potential model is used for calculation of phonon spectra and thermal expansion
in the two phases of ThGeO4. The calculations are able to reproduce large difference in thermal
expansion of the two phases of ThGeO4 and enable microscopic understanding in them.