We have investigated the thermal transport properties of SrxBi2-xSe3 (x=0, 0.05, 0.2). The samples were synthesized by melt route method followed by vacuum hot press. The structural and morphological information of sample has been retrieved using x-ray diffraction (XRD) and scanning electron microscopy (SEM). The thermal transport measurement were performed in the temperature range of 300-550 K. It is found that with increasing Sr content the total thermal conductivity of the material decreases which is attributed to the enhance phonon scattering due to natural grown layered structure and defect induced by Sr doping.