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Author(s) |
Kulkarni, M. S.; Mishra, D. R.; Muthe, K. P.; Singh, A.; Roy, M.; Gupta, S. K.; Kannan, S. (RSSD;TPPED;NM&SCD)
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Source |
Radiation Measurements, 2005. Vol. 39: pp. 277-282 |
ABSTRACT
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Single-crystal α-Al2O3(10×10 mm2,0.4 mm thick) was treated in vacuum at temperatures below its melting point in the presence ofgraphite. The possibility of this approach as an alternative method to the crystal growth in the reduced atmosphere for obtaining dosimetry grade α-Al2O3°C for TL and OSL dosimetry applications has been explored. The absorption peaks at 203, 225, and 255 nm in the treated sample con)rmed the formation of negative ion vacancy in the crystalline α-Al2O3.The TL readout of the processed samples showed two well-de)ned glow peaks at 56°C and 191°C for 4 K/s heating rate.The TL and OSL sensitivities of the samples were seen to strongly depend on process temperature and process time and are comparable to those produced by conventional method. The OSL response of these samples is found to be linear from 50 μGy to 1 Gy. The results show that, with this approach, it is possible to introduce the desired dosimetric traps into crystalline α-Al2O3 in a ontrolled manner. |
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